Two New Models of SWIR Megapixel Cameras

Two New Models of SWIR Megapixel Cameras

NIT proudly introduces new additions to its megapixel SWIR camera lineup – SenS 1280:

Two new SWIR cameras:

  • Sens 1280 CxP is an HD resolution SWIR camera with a CoaXpress video output compatible with the GenIcam protocol. 
  • Sens 1280 SDI equipped with an SDI video output, compatible with most video platforms used in ground, naval, and aircraft applications

Key Features

These two models are equipped with NIT NSC1901 SWIR sensor, a 1280×1024 pixel focal plane array with a pitch of 10µm. This advanced InGaAs sensor exhibits the best Signal-to-Noise Ratio (SNR) and sensitivity of the market. 

In addition, both models use NIT’s latest embedded video processing unit for onboard processing of images at full frame rate and minimal latency delay.


  • Sens 1280 CxP: Industrial machine vision, semiconductor inspection, solar cell inspection.
  • Sens 1280 SDI: Wide-area surveillance in gimbal and naval platforms.


OEM modules are also available with a low form factor for easy integration into different systems.

The SenS 1280 SDI is available for purchase as other interfaces, including USB 3.0 and CameraLink (both normal and smart versions).

The SenS 1280 CxP will be first presented at SPIE Photonics West 2024.

SenS 1280 CxP SWIR cameras

Don’t miss the SenS 1280 CxP showcase at SPIE Photonics West 2024.

30 January – 1 February 2024
San Francisco, California, USA

Save the day and join us at booth #5419

SenS 1280 CxP at SPIE Photonics West 2024 booth 5419
Happy Holidays !

Happy Holidays !

Happy Holidays!

Wishing you a Merry Christmas & Happy New Year.

As we approach the festive season, we would like to extend our warmest wishes to you and your team. May this holiday season bring joy, prosperity, and success to you and your loved ones. We are thankful to our amazing clients and our valued partners for paving the way to historic growth in 2023.

We hope we helped you make 2023 your best one yet through our continued focus on innovating SWIR imaging solutions.

Stay tuned for more updates on these groundbreaking SWIR cameras.

Wishing you a joyful holiday season and a prosperous New Year 2024!

See you in the New Year!

We are closed on Monday (25th Dec 2023) and Monday (1st Jan2024)

Where we’re heading…

World-class SWIR products at Booth #4110

SPIE Photonics West 2024 (30 Jan – 1 Feb 2024), San Francisco, California, USA.

We look forward to seeing you at booth #5419 to present our latest SWIR solutions.

Save the date!

Schedule an appointment for a discussion at our booth during the trade show! We look forward to your visit!

NITVision 1.5 and NITLibrary 3.4.2 –  Enhanced Compatibility and Feature updates

NITVision 1.5 and NITLibrary 3.4.2 – Enhanced Compatibility and Feature updates

We are thrilled to announce the release of the latest versions of our powerful software solutions, NITVision 1.5 (GUI) and  NITLibrary 3.4.2 (SDK), marking an advancement in our commitment to user-focused development.

Enhanced OS Compatibility

The new versions now extend support to the latest operating systems, including Windows 11, Debian 12, and Ubuntu 22.04, offering a seamless experience to our diverse user base across various platforms.

Expanded Support Version

New versions of Python are added to the versions currently supported.


x86-64 Windows Yes
Linux Debian 11
Debian 12
Ubuntu 20.04
Ubuntu 22.04
Arm64   Debian 11
Debian 12
Ubuntu 20.04
Ubuntu 22.04

NITLibrary 3.4.2

x86-64 Windows C++
Python (3.6/3.8/3.9/3.10)
Linux Debian 11: C++
Python (3.9)
Debian 12 C++
Python (3.11)
Ubuntu 20.04 C++
Python (3.8)
Ubuntu 22.04 C++
Python (3.10)
Arm64 Linux Debian 11 C++
Python (3.9)
Debian 12 C++
Python (3.11)
Ubuntu 20.04 C++
Python (3.8)
Ubuntu 22.04 C++
Python (3.10)


NITVision 1.5 and NITLibrary 3.4.2 are available for download from our website, providing users with access to the latest advancements and features.

For more information, and detailed release notes, and to explore these new updates, contact our support service.

We look forward to bringing more innovations and improvements in the future.

Enhancing Solar Panel Efficiency with SWIR Solar Panel Inspection

Enhancing Solar Panel Efficiency with SWIR Solar Panel Inspection

Solar energy has become a crucial player in the renewable energy sector, and as the demand for solar power increases, so does the importance of maintaining and optimizing solar panel efficiency. Solar panels are exposed to various environmental factors that can hinder their performance. That’s where Short-Wave Infrared (SWIR) solar panel inspection comes into play. In this article, we’ll explore what SWIR solar panel inspection is, its significance, and how it can maximize solar panel efficiency.

What is SWIR Solar Panel Inspection?

Short-wave infrared (SWIR) solar panel inspection is a cutting-edge technology that uses infrared imaging to assess the condition and performance of solar panels. SWIR cameras capture images in the range of 900 to 1700 nanometers, which is beyond the range of visible light. This allows them to identify issues that aren’t visible to the naked eye, such as micro-cracks, hot spots, and electrical failures.

Significance of SWIR Solar Panel Inspection

  • Detection of Micro-Cracks:

    Microcracks, often invisible to the human eye, can lead to reduced energy production and eventually, panel failure. SWIR inspections can pinpoint these tiny defects, allowing for timely repairs and minimizing energy loss.

  • Hot Spot Identification:

    Hot spots, for instance, caused by localized overheating, can lead to cell damage and reduced panel efficiency. SWIR technology can identify these hot spots early, preventing further damage.

  • Electrical Fault Detection:

    SWIR inspections can reveal faults like broken bypass diodes or malfunctioning interconnections. So, identifying and repairing these issues promptly can extend the lifespan of solar panels.

  • Preventive Maintenance:

    Regular SWIR inspections can be incorporated into a preventive maintenance strategy. Therefore, ensuring that solar panels operate at peak efficiency over their entire lifespan.

  • Cost Savings:

    By detecting and addressing issues early, SWIR solar panel inspections can save money on repair and replacement costs in the long run.

Aspect SWIR Imaging Visual Inspection Infrared Thermography
Detection of Micro-Cracks Excellent Limited Limited
Hot Spot Identification Excellent Limited Excellent
Electrical Fault Detection Excellent Limited Limited
Detects Anomalies Beyond Visible Yes No Yes
Real-time Monitoring Capability Yes No Yes
Cost-effectiveness Highly cost-effective Lower cost Moderate cost
Ease of Integration Easy to integrate Simple Simple
Preventive Maintenance Efficiency High Moderate Moderate
Lifespan Extension of Solar Panels Yes Limited Limited
Benefits Enhanced efficiency, cost savings Visible defect recognition Hot spot detection, energy loss prevention

This table provides a quick comparison of SWIR imaging with visual inspection and infrared thermography in various aspects of solar panel inspection, highlighting the strengths of SWIR imaging, particularly, in detecting micro-cracks, hot spots, and electrical faults that might go unnoticed with other methods. In addition, it emphasizes the real-time monitoring capability, cost-effectiveness, and ability to extend the lifespan of solar panels.

Maximizing Solar Panel Efficiency

SWIR solar panel inspection can be an integral part of a broader strategy to maximize solar panel efficiency. Here are some additional tips:

  • Regular Cleaning:

    Keep solar panels clean to ensure optimal light absorption.

  • Shade Management:

    Minimize shading from nearby structures or vegetation to maximize exposure to sunlight.

  • Efficient Inverter Systems:

    Invest in high-quality inverters to maximize energy conversion.

  • Regular Monitoring:

    Implement a monitoring system to keep track of energy production and detect anomalies in real-time.

In conclusion, SWIR solar panel inspection is a game-changer in the solar energy industry. It provides an efficient and cost-effective method for identifying and addressing issues that affect solar panel performance. Embracing SWIR technology and incorporating it into the solar panel maintenance strategy not only increases energy production but also extends the lifespan of solar panels. Certainly, as the demand for clean energy continues to grow, SWIR solar panel inspection will play a vital role in harnessing the full potential of solar power.

SWIR imaging solutions

Contact NIT today for more information about our SWIR imaging solutions and solar panel inspection applications.

NIT SWIR cameras
NIT and INSP will exhibit the world’s first HgTe CQD SWIR camera in Paris

NIT and INSP will exhibit the world’s first HgTe CQD SWIR camera in Paris

NIT and INSP will exhibit the world’s first HgTe CQD SWIR camera during the Forum Innovation Defense held in Paris on 23-28 November.

NIT (New Imaging Technologies) and INSP (Institute of Nanosciences of Paris) are proud to announce the debut of the world’s first Short-Wave Infrared (SWIR) camera featuring an innovative HgTe (Mercury Telluride) Quantum Dot focal plane array sensor. This groundbreaking technological achievement will be showcased during the Forum Innovation Defense, taking place in Paris from November 23 to November 28, 2023.

The collaboration between NIT and INSP has resulted in a pioneering SWIR infrared camera, utilizing the advanced HgTe quantum dot sensor technology, which promises unprecedented capabilities in defense and security applications.

Selected by the French Ministry of Defense, NIT, and INSP will present the culmination of years of dedicated research and development efforts in this revolutionary camera. The development of the CQD (Colloidal Quantum Dot) sensor was made possible through funding provided by the French Defense Procurement Agency (DGA) and the National Research Agency, part of a rigorous three-year R&D program.


Overcoming Challenges in SWIR Semiconductor Inspection: Solutions and Advancements

Overcoming Challenges in SWIR Semiconductor Inspection: Solutions and Advancements

Semiconductor inspection is a critical process in the electronics industry, ensuring the quality and reliability of integrated circuits. In recent years, Short-Wave Infrared (SWIR) imaging has emerged as a promising technology for semiconductor inspection due to its ability to penetrate silicon and other materials, offering valuable insights into the production process. However, SWIR imaging isn’t without its challenges. In this article, we’ll explore the obstacles posed by noise, calibration, and cost in SWIR semiconductor inspection, along with the solutions and advancements that are shaping the field.

Understanding SWIR Semiconductor Inspection

What is SWIR technology?

SWIR technology falls in the wavelength range of approximately 900 to 1700 nanometers. It allows for the detection and visualization of details that are otherwise invisible to the naked eye or traditional inspection techniques, making it a valuable tool in semiconductor inspection.

Learn more about how SWIR cameras work.

Role of SWIR Inspection in Semiconductor Manufacturing

Defect detection and identification are critical in semiconductor manufacturing to ensure the production of reliable and high-performance components. SWIR inspection plays a crucial role in this process by enabling the identification of defects that may otherwise go unnoticed. By providing detailed imaging and analysis, SWIR technology contributes to quality control and enhances efficiency in semiconductor production.

Using SWIR Imaging Devices in Semiconductor Inspection

Challenges in SWIR Semiconductor Inspection 

  • Noise:

    Noise in SWIR images can degrade image quality, making defect detection and analysis difficult. This is particularly problematic in low-light conditions

  • Calibration:

    Accurate calibration is crucial for precise semiconductor inspection. SWIR cameras must be calibrated to ensure consistent and reliable measurements, which can be complex and time-consuming.

  • Cost:

    Historically, SWIR cameras have been expensive, limiting their widespread adoption for semiconductor inspection applications.

Solutions and Advancements 

  • Noise Reduction Techniques:

    Cutting-edge noise reduction algorithms are being developed to enhance SWIR image quality. These algorithms intelligently filter out noise while preserving essential details, improving defect detection accuracy.

  • Advanced Calibration Methods:

    Researchers are working on automated calibration methods that reduce the need for manual adjustments. These advancements streamline the calibration process, minimizing downtime and increasing efficiency.

  • Cost-Effective SWIR Cameras:

    Thanks to technological progress, the cost of SWIR cameras is gradually decreasing. This cost reduction opens opportunities for wider integration of SWIR imaging in semiconductor inspection processes.

Semiconductor inspection with NIT SWIR cameras

For businesses looking to harness the benefits of SWIR semiconductor inspection, it’s essential to consider reliable and high-quality SWIR cameras.

New Imaging Technologies offers a range of SWIR cameras that are engineered to address the challenges mentioned above. These cameras boast cutting-edge noise reduction capabilities, advanced calibration mechanisms, and a cost-effective approach, making them an ideal choice for semiconductor inspection tasks.

SWIR semiconductor inspection holds significant promise for the electronics industry. While challenges like noise, calibration, and cost have posed obstacles, innovative solutions, and technological advancements are propelling the field forward. As the capabilities of SWIR cameras continue to evolve, businesses can confidently embrace this technology for more accurate and efficient semiconductor inspection processes.

SWIR imaging solutions

Contact NIT today for more information about our SWIR imaging solutions for semiconductor, silicon wafer & solar panel inspection.

NIT SWIR cameras