Lisa SWIR – The Ultimate Tool for Electronic Components, Silicon Wafers, and Solar Panels Inspection

Lisa SWIR – The Ultimate Tool for Electronic Components, Silicon Wafers, and Solar Panels Inspection

Lisa SWIR – The Ultimate Tool for Electronic Components, Silicon Wafers, and Solar Panels Inspection.

Lisa SWIR is a line scan SWIR camera using the NSC1801 SWIR sensor developed by NIT which has 2048 pixels, with a pixel size of 7.5um x 7.5um. The line repetition rate is fully programmable and can go up to 60KHz, the digital output being 14bits with Camlink format. The camera can be triggered through an external signal coming from the conveyor and will provide an extremely precise timing definition of the image acquired.
Lisa SWIR was specially developed for semiconductor inspection, with the ability of SWIR wavelength to see through silicon.  Inspection of silicon wafers or of single dies can be easily set up.
The solar panel both at production and on-site can be inspected by Lisa SWIR providing extremely accurate images of photoluminescence induced by small defects even at low contrast.

Thanks to its small pixel size of 7.5um, Lisa SWIR procures extremely sharp and crisp images of defects in materials at high throughput. The small size of each pixel of 7.5um compared to larger competing arrays with 12um pixel size or more is a major breakthrough in reducing production costs. Moreover, the smaller pixel size induces a smaller array size, which in turn allows using smaller optics for the same field of view.

The SWIR sensors are manufactured at the NIT factory using an innovative bonding process that guarantees the lowest achievable number of defects in the line.

Together with its partner in Singapore (vitalvisiontechnology.com) NIT and VITAL Vision can offer a complete solution for semiconductor inspection, that includes a high homogeneity illumination system and real-time inspection software

NIT is a French company specializing in the design and production of SWIR InGaAs sensors, both 2D arrays or linear arrays. NIT is vertically integrated and produces sensors, cameras, and software.

Vital Vision Technology is the leader in Machine Vision Components and Technologies in Southeast Asia, providing companies with cutting-edge vision solutions to price-sensitive vision solutions.

The SenS 1280V-ST HD SWIR camera is ready for sale

The SenS 1280V-ST HD SWIR camera is ready for sale

NIT expands its SWIR camera portfolio with the latest SenS 1280S-VT model which integrates NIT 1280x1024pixel @ 10um sensor. The camera operates with a USB3 output and is bundled with GUI – NITVISION software and SDK for major operating systems.

Sens1280V-ST exhibits outstanding world-class performances such as :

  • Readout noise of typ. 27e-
  • QE > 85%
  • Frame rate > 60Hz at full frame
  • Programmable Regions of Interest
  • 14bits Digital output

Applications include laser beam analysis, silicon, and solar wafer inspection, process control, medical, food analysis, microscopy, etc.

Sens1280V-ST is the first of the long list of HD cameras to be released in 2021, the next available one will be a Camlink version due in July.

Together with the high-performance air-cooled camera series – HiPe SenS, released last year, the SenS series propose more resolution options to clients in Linear response: VGA (640x512px) and SXGA (1280x1024px).

SenS 1280V-ST will be delivered with NITVISION. The new NITVISION software supports all the NIT cameras/ modules delivered today with USB3.0 and GigE interface. NITVISION manual guide and other related support documentation will be updated on the user’s library.

preview-NITVISION
White paper: Infrared sensing using nanocrystal toward on demand light matter coupling

White paper: Infrared sensing using nanocrystal toward on demand light matter coupling

Infrared sensing using nanocrystal toward on demand light matter coupling

Eva Izquierdo1, Audrey Chu1,2, Charlie Gréboval1, Gregory Vincent2, David Darson3, Victor Parahyba4, Pierre Potet4, Emmanuel Lhuillier1*
1 Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, 75005 Paris, France.
2 ONERA – The French Aerospace Lab, 6, chemin de la Vauve aux Granges, BP 80100, 91123 Palaiseau, France.
3 Laboratoire de physique de l’Ecole Normale Supérieure, ENS, Université PSL, CNRS, Sorbonne Université, Université de Paris, 75005 Paris, France
4 New Imaging Technologies SA, 1 impasse de la Noisette 91370 Verrières le Buisson, France

Abstract

Nanocrystals are semiconductor nanoparticles whose optical properties can be tuned from UV up to THz. They are used as sources of green and red light for displays, and also show exhibit promises to design low-cost infrared detectors. Coupling subwavelength optical resonators to nanocrystals film enables to design photodiodes that absorb 80% of incident light from thin (<150 nm) nanocrystal film. It thus becomes possible to overcome the constraints linked to the short diffusion lengths which result from transport by hopping within arrays of nanocrystals enabling a high photoresponse detector operating in the SWIR range

NIT starts production of its SWIR SXGA image sensor

NIT starts production of its SWIR SXGA image sensor

NIT is pleased to announce the sampling and production of its latest high definition SWIR image sensor

NSC1901T-SI is the latest generation of NIT SWIR sensor having a pixel resolution of 1280×1024 pixels at a pitch of 10um, with the extraordinary low readout noise performance of typically 25e-, thanks to its innovative input stage and in pixel CDS.

NSC1901T-SI delivers up to 120 frames per second, operates in IWR and ITR mode, and can be combined with ROI readout. This first member of the SXGA family has a linear response only. The dual-mode Linear and Logarithmic response will be available in Q3-2021.

NSC1901T-SI is manufactured using the advanced NH process developed by NIT. This in-house technology allows the production of hybrid components without using the traditional Indium bump technique leading to high yield manufacturing.

NSC1901T-SI will be integrated first into the NIT SenS camera line – the SenS 1280 camera is due to be out in May 2021.

Explore SenS 1280 camera series

High sensitivity SXGA SWIR cameras
NITVISION – A brand new software for NIT USB and GigE cameras

NITVISION – A brand new software for NIT USB and GigE cameras

Since launching, we’ve incorporated a ton of great new features into our software to help you take full control of the camera. Never settle down! Today we’re glad to introduce you to a brand new camera software that has been developed to simplify your workflow. Moreover, now you can run your USB and GigE cameras with a unique software – NITVISION.

NITVISION is our new software providing all the tools necessary to control our USB and GigE cameras, including our brand new Mpix SWIR camera – SenS 1280.

It replaces our legacy GUIs:  WiDyVISION, MagicVISION, and NITViewerGIGE.
This display application is based on our new NITLibrary 3.0 SDK to help you build your own blocks around our SDK.

With NITVISION, you can access every feature you need for image monitoring:

  • Control of USB and GigE cameras.
  • Live streaming.
  • Snapshot images of raw and filtered captures (TIFF, PNG, JPEG formats).
  • Recording of raw and filtered streaming (PTW and AVI formats).
  • Analyzing and profiling tools.

You will soon be able to download our software directly from the Download page (May 2021).

Lytid, NIT and the National French Research Agency have partnered to develop SIRIS the ultimate cooled SWIR camera

Lytid, NIT and the National French Research Agency have partnered to develop SIRIS the ultimate cooled SWIR camera

Lytid has released the SIRIS SWIR camera – a deep cooled SWIR camera based upon a Lin/Log InGaAs sensor from NIT and image processing algorithms from the French Research Agency (CNRS).

SIRIS exhibits the best performance on the market for read-out noise (<10e-) and dynamic range (>120dB) simultaneously, thanks to NIT Lin/Log 1601 SWIR sensor. SIRIS is deep cooled down to 50K with a long-life cryocooler allowing a drastic reduction of dark current. Exposure time over one hour can be easily obtained. Everything is fully integrated into a compact and plug-and-play casing based on Lytid’s advanced photonic system integration.

Moreover, SIRIS incorporates advanced noise reduction algorithms developed by ENS-CNRS, among which non-destructive read-out noise reduction is embedded. The resulting noise performance is drastically reduced and the final readout noise is less than 10e-.

Applications for SIRIS cover high-end imaging such as astronomical research, bio-medical imaging, bioluminescence…