LiSaSWIR 2048

Line-scan array SWIR camera

  • Line-scan array
  • 2K resolution – 2048x1px @7.5µm pixel pitch
  • Linear response mode: High sensitivity
  • CameraLink interface
  • Bad Pixels Replacement and embedded Non-Uniformity Correction (NUC)

Technical Specification

Sensor NSC1801T-SI
Material InGaAs
Resolution 2048x1
Pixel pitch 7.5μm
Spectral response 0.9 to 1.7μm
Dual response Linear (Low, Medium & High Gain)
Modes ITR, ROI
QE >85%
Output CameraLink
Frame rate 60kHz full frame
Exposure time 10μs to 220ms
Read-out noise
  • 250e- (High Gain)
  • 450e- (Medium Gain)
  • 4000e- (Low Gain)
Trigger IN/OUT (LVTTL-Hirose connector)
IN through CC1 (CL interface)
Selectable delay
Power Range 12V
Dimension 46x46x65.5mm
Mount C-Mount native
Weight < 250g
ADC 14 bits
Operating Temp 0°C to +65°C

Image example

LiSaSWIR's image 1
Image 1. A Silicon Wafer captured by the LiSa SWIR 2048
As Silicon is transparent to Short Wave Infrared wavelength (SWIR), backside wafer inspection can be done (defects detection, pattern alignment, pattern defect inspection, and edge-position bonding inspection)

LiSaSWIR's image 2
Image 2. Comparison of Chipset image
Made with Visible Linescan camera (left) vs. the new LiSa SWIR (right)
Thanks to LiSa SWIR, you will be able to inspect through integrated circuit chips for quality inspection. Defects can be easily detected as cracks, voids, particles…


Interface GUI SDK
CameraLink (Embedded) NITLink No


With its unique performance and features, the LiSaSWIR 2048 is the perfect camera for industrial applications. Its 2048×1 pixels resolution with frame rate of 60kHz, Bad Pixels Replacement, and embedded Non-Uniformity Correction offer a comfortable Field of view for inspection of semiconductor/wafer/solar cell panel or food sorting, hot glass inspection.
CameraLink interface, compact size of 46* 46 * 65.6 mm, lightweight, LiSaSWIR is easy to integrate into any process control system.