Semiconductor inspection
Reveal the heart of your materialInspection has become one of the key processes in the semiconductor industry: Detecting defective items along the production line helps to improve yields and the overall productivity of one of the biggest industry.
For the past years, the SWIR band has been recognized as one of the best wavelength regions for semiconductor inspection. Whether it is for detecting cracks and defect on a wafer or solar cell panels, or for achieving a failure analysis of integrated circuits, InGaAs wavelength (900m- 1700nm) imaging device are suited for seeing through inside silicon.
However, the SWIR imaging devices must present an attractive performance/price ratio to ease the final integration into the production lines.
Demonstration
Because we believe images are better than words.
Why NIT?
SWIR band
Small pixel pitch
Cost-effective
Recommended products
SenS 1280
- 1280x1024px(SXGA) @10μm2 pixel pitch
- Readout Noise 27e-
- USB3.0
- 58 x 58 x 70 mm3
- IN/OUT mode (LVTTL)
WiDy SenS
- 640x 512 | 15×15μm2 pixel
- Readout Noise <50e-
- USB 3.0/CameraLink/GigE/Analog
- 46 x 46 x 57mm3
- High Sensitivity & HDR
- IN/OUT mode (LVTTL)
LiSaSWIR 2048
- 2480x1px @7.5μm2 pixel pitch
- Readout Noise 250e- (High Gain)
- USB3.0
- 46 x 46 x 65.6 mm3
- IN/OUT mode (LVTTL-Hirose connector)
- IN through CC1 (CL interface)