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Semiconductor inspection

Reveal the heart of your material

Inspection has become one of the key processes in the semiconductor industry: Detecting defective items along the production line helps to improve yields and the overall productivity of one of the biggest industry.

 

For the past years, the SWIR band has been recognized as one of the best wavelength regions for semiconductor inspection. Whether it is for detecting cracks and defect on a wafer or solar cell panels, or for achieving a failure analysis of integrated circuits, InGaAs wavelength (900m- 1700nm) imaging device are suited for seeing through inside silicon.

 

However, the SWIR imaging devices must present an attractive performance/price ratio to ease the final integration into the production lines.

Demonstration

Because we believe images are better than words.

Why NIT?

SWIR band

Small pixel pitch

Cost-effective

Recommended products

WiDy SWIR

HDR & compact
  • 640×512 | 15x15um2 pixel (VGA) /320×256 | 25x25um2 (QVGA)
  • Readout Noise <200e- (VGA)/ <300 e-(QVGA)
  • USB3.0/CameraLink/Analog/GigE
  • 49 x 49 x 42 mm3
  • IN/OUT mode (LVTTL)

Find the right product for your applications!

Find the right product for your applications!