GATED IMAGING – Part 2

Lisa SWIR - The Ultimate Tool for Electronic Components, Silicon Wafers, and Solar Panels Inspection. Lisa SWIR is a line scan SWIR camera using the NSC1801 SWIR sensor developed by NIT which has 2048 pixels, with a pixel size of 7.5um x 7.5um. The line repetition...

NIT expands its SWIR camera portfolio with the latest SenS 1280S-VT model which integrates NIT 1280x1024pixel @ 10um sensor. The camera operates with a USB3 output and is bundled with GUI - NITVISION software and SDK for major operating systems. Sens1280V-ST exhibits...

New Imaging Technologies (NIT) thanks the French Government for their support with the “France Relance” Program in developing the industrialization of our novel in-house stacking technology, recognizing NIT’s breakthrough R&D process development in SWIR sensor...