NIT launches a new SWIR camera on June 25th. The WiDy SenS GigE, with a proven standard interface, for industrial applications.

Welcome to our product launch event.

Today we gonna introduce to you our new product: the WiDy SenS GigE.

Our event includes:

•  Introduce new features and advantages
•  Demonstrate camera performance

The New WiDy SenS GigE is a VGA SWIR Camera. The camera integrates NIT flagship Sensor NSC1601, with Dual-Mode.

It provides an image of 640 x 512 pixels, with a very High Dynamic Range of 120dB (for high flux scene and a high sensitivity mode with a readout noise of 50e-).

This WiDy SenS GigE features a Gigabit Ethernet output & a brand-new Hirose connector. This connector combines power supply and Triggering inputs/outputs options.

With a complete SDK compatible with Windows or Linux, the WiDy SenS GigE is a perfect SWIR option for easy integration into industrial equipment.

The WiDy SenS GigE has been designed to meet the requirements of new industrial applications with a proven standard interface.

Major applications include Semiconductor inspection/ Wafer inspection, but also new emerging applications, such as Monitoring of Additive manufacturing or even Sorting machines.

• • •  Watch our Semiconductor demonstration video
    •  Watch our Additive manufacturing with SWIR camera

The WiDy SenS completes the existing NIT SWIR products line – WiDy family:

• The WiDy SWIR cameras, providing the high dynamic range in USB, CameraLink & GigE.
• The WiDy SenS cameras, (HDR and High sensitivity) in USB, CameraLink & GigE.
• The WiDy NaNo, with an impressive form factor, providing HDR images and a USB3.0 form factor.

It is officially available through NIT sales channels and with a short lead time.

Thank you for joining us.

See you in our next innovation!

MERCI!

JOIN US ON JUNE 25th

NIT NEW SWIR CAMERA LAUNCH EVENT

New Imaging Technologies invites you to discover the next SWIR member of WiDy family at 2 P.M (UTC+2) on TUESDAY, JUNE 25TH.

•  Introduce new features and advantages
•  Demonstrate camera performance

To make it easier for you to check out our new product from anywhere, this event will be diffused on the NIT website.

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You can also join our stream on our LinkedIn, Twitter and YouTube channels

NIT Additive Manufacturing demo including WAAM and Laser Additive Manufacturing.

See the melt-pool and its hydrodynamics like never before!

A better definition of the melt-pool

To summarize why the WiDY SWIR camera is the perfect ally for Additive manufacturing process, we are glad to bring you our demonstration video.

This is the result of our collaboration with the Institut Maupertuis -a French technological center specialized in automated production technologies.

Through this test, we illustrate how our SWIR camera – WiDy SenS performs in very high flux scenes of the melt pool in Wire Arc Additive Manufacturing (WAAM) and Laser Additive Manufacturing processes:

• True shape and geometry of the Melt pool without blooming effect
• The temperature gradient and flow dynamics with SWIR wavelength.

Additive manufacturing case study

If you are interested in our anti-blooming technology for industrial applications and our SWIR products, we are always here to discuss more.

Related products

• WiDy SenS camera – NSC1601T-SI
• MAGIC camera – MC1003

NIT launches a new SWIR Gating imaging demo video. The video illustrates the WiDy SenS Gating capabilities and how to cover several applications with a single camera.

Get to know more our WiDy SenS in gating imaging application.
We glad to announce that our newest test of WiDy SenS camera is now available. This test compares the WiDy SenS performance, featuring SWIR Gated mode, with a visible camera. It illustrates the WiDy SenS Gating capabilities and how to over several applications with a single camera.

• Tomography
• See-spot
• Drone detection

Tomography.

3D reconstruction using Gating imaging
Step by Step delay increments for a 3D evaluation of the scene

Drone detection.

Drone detection in critical outdoor environment using the gated imaging capability of the WiDy SenS.
Complete background and foreground suppression for a clear identification of the drone threat.

Join us at SPIE Baltimore.
Attending SPIE Defense & Commercial sensing 2019? We’re excited to meet you at booth #224 and share our expert guidance, technologies, and SWIR products for advancing your vision ability in your application.

What we bring to SPIE 2019

Our WiDy SenS series, High Sensitivity & High Dynamic Range SWIR cameras, with the Gated mode option, are capable of providing high-quality images in all lighting conditions.

Don’t miss the chance to test our SWIR cameras’ performances on-site and discuss with our experts to get the cutting-edge SWIR products.
Schedule our meeting in advance to have a quality discussion.

See you there from April 16th -18th, 2019!

Get to know more our SWIR cameras in action.

With many advantages of NIT SWIR cameras, such as HDR patented technology, anti-blooming native functions, high frame rate, working with lasers become simpler.

Following the first part of our case study – Additive manufacturing, this time, discover how our SWIR cameras give the ability to bring an extra eye on the melt pool or any similar conditions.

Watch our demo to see the advantages of NIT SWIR cameras for semiconductor inspection

SWIR for inspection – Reveal the heart of your material.
For the past years, the SWIR band has been recognized as one of the best wavelength regions for industrial inspection. Whether detecting cracks or defects on a wafer or solar cells panels, InGaAs imaging devices are suited for seeing through silicon.

With HDR patented technology, high sensitivity, and a plug-and-play integration, NIT SWIR cameras, especially WiDy SenS, can help inspection process easier, more accurate and cost-effective.

Our demonstration, featuring NIT WiDy SenS and Effilux SWIR backlight, illustrates the advantages of NIT SWIR cameras versus visible cameras in detecting defects, trapped air and component observation for a silicon wafer.

Thanks, Effilux for this collaboration.

Happy to help.

NIT experts team is always available for all your needs. Please feel free to contact us to get your answers as soon as possible. 

About WiDy SenS

Among the WiDy family, the WiDy SenS offers the highest sensitivity in the SWIR band, makes it suitable for Semiconductor inspection. Thanks to a small pixel pitch of 15µm, the WiDy SenS camera can easily be used in a microscope inspection machine for small defect detections. The WiDy SenS cameras come with a 46x46x57mm3 form factor and represent a cost-effective solution for integration into a semiconductor production line.