Boost the throughput of your inspection machine with NIT high-definition, fast-frame-rate InGaAs cameras.
In the fast-paced world of semiconductor and solar panel manufacturing, precise and efficient inspection is crucial. NIT designs and manufactures high-resolution SWIR InGaAs cameras to meet the demanding requirements of modern fabs. They deliver superior performance in silicon wafer and solar panel inspection.
Why SWIR Cameras for Semiconductor and Solar Panel Inspection?
Manufacturers frequently use SWIR cameras for quality assurance of silicon wafers and associated processes, taking advantage of silicon’s transparency to SWIR wavelengths. To achieve the high throughput required by modern semiconductor fabs, the SWIR cameras must offer high pixel count, small pixel size, high sensitivity, and high frame rate, all being an order of magnitude greater than what is currently available from vendors on the market.
NIT’s Advanced SWIR Camera Solutions for Semiconductor and Solar Panel Inspection
To address these demanding applications, NIT has developed a line of SWIR cameras dedicated to silicon wafer inspection :
SenS 1280:
A Megapixel high sensitivity 1280×1024 pixel focal plane array of 10µm size. The width-to-height ratio is 1.25 and is therefore particularly appropriate to cover large silicon surface area. Electronic noise is low to 30e-.
SenS 1920:
A Two-megapixel high sensitivity 1920×1080 pixel focal plane array of 8µm size. The SenS 1920 exhibits a record noise of less than 25e-. The rectangular aspect ratio of 1.88 is particularly suitable for inspecting the edges and boundaries of long silicon circuits.
These SWIR cameras can operate at full frame at 60Hz and much more by subwindowing.
Our cameras and their performances are unique as they don’t use third-party sensors. NIT powers both cameras with its own SWIR InGaAs sensors, NSC1901 & NSC2101, designed and manufactured in-house. Additionally, NIT offers a comprehensive SDK package compatible with x86-64 (Windows and Linux OS) and Arm64 (AARCH64) simplifying the integration into existing inspection systems.
High-resolution SWIR imaging solutions
Enhance semiconductor and solar panel inspections with NIT’s high-definition SWIR InGaAs cameras for top-quality and efficient production.
