Introduction

High-speed SWIR cameras and line-scan SWIR cameras are becoming essential tools for modern industrial inspection, semiconductor manufacturing, laser monitoring, and other advanced imaging fields where speed, sensitivity, and reliability are critical. As demand for higher throughput and better detection capabilities grows, Short-Wave Infrared (SWIR) imaging provides unique advantages by revealing details invisible to standard visible cameras. In this article, we explore how SWIR imaging enhances high-speed industrial inspection workflows and how different SWIR camera architectures—line-scan and area-scan—fit into various application needs.

Challenges in Semiconductor Inspection

Semiconductor manufacturing demands exceptional precision and reliability at every stage — from wafer fabrication to packaging. Detecting micro-defects such as cracks, contamination, or pattern irregularities is crucial to maintain high yield and prevent costly failures.

Traditional visible-light cameras often fail to reveal such defects because silicon, the primary material in semiconductor devices, is opaque to visible light but transparent in the Short-Wave Infrared (SWIR) spectrum. As a result, a high-speed SWIR camera becomes a critical tool for detecting defects hidden beneath silicon surfaces.

As inspection lines move toward higher speeds and smaller geometries, manufacturers require high-performance SWIR cameras (Line-scan, Area-scan) that can deliver excellent image quality, speed, and stability under demanding industrial conditions.

Detecting Micro-Defects with High-Speed SWIR Cameras

SWIR cameras enable engineers to see beyond the visible spectrum, revealing information invisible to traditional imaging systems. In semiconductor production, they are used for:

• Wafer and die inspection: Detecting micro-cracks, edge chips, and surface irregularities.
• Bond and interconnect analysis: Inspecting layers and verifying bonding integrity.
• Encapsulation and packaging inspection: Identifying trapped particles or voids in encapsulant materials.

NIT’s high-speed SWIR cameras are built around proprietary InGaAs sensor technology designed for high sensitivity, low noise, and high dynamic range. These features ensure reliable defect detection, even in high-reflectance environments typical of semiconductor manufacturing.

Line-Scan vs Area-Scan SWIR Cameras

Choosing between a line-scan and an area-scan SWIR camera depends on the inspection setup, the object’s motion, and the required resolution.

Line-Scan SWIR Cameras

Line-scan SWIR cameras capture one line of pixels at a time as the object moves under the field of view. They are ideal for continuous or moving inspection processes such as:

• Wafer or substrate inspection on conveyor systems
• Web or roll-to-roll material analysis
• Inline defect detection during dicing or polishing

Advantages:

• Perfect for high-speed scanning and continuous processes
• Offers uniform illumination and consistent resolution across long surfaces
• Easily integrated into industrial automation systems

Considerations:

• Requires precise synchronization between the camera and object motion
• Not suited for static or randomly positioned samples

LiSaSWIR 2048 v2 – New Line-scan SWIR camera
Ideal for semiconductor inspection lines requiring high resolution, high speed, and excellent uniformity. Its 2048-pixel resolution delivers outstanding defect and edge detection on silicon wafers and semiconductor substrates.

LiSaSWIR 2048 image example

Area-Scan SWIR Cameras

Area-scan cameras capture a full image frame at once, making them suitable for stationary or small field-of-view inspection tasks. These cameras are particularly effective for detailed defect analysis, component inspection, or laboratory evaluation.

NIT offers a complete range of area-scan SWIR cameras, from QVGA to Full HD resolution, enabling users to choose the best fit for their inspection needs — from compact, high-speed sensors to large-format, high-resolution imaging systems.

Advantages:

• Provides instant full-field images, ideal for stationary samples or slow-moving processes
• Supports high-resolution imaging for fine defect analysis
• More flexible setup — no motion control required

Considerations:

• Limited by frame rate for continuous line inspections
• May require higher bandwidth interfaces for large-format models

SenS 1920 — Full HD resolution, high sensitivity
Perfect for applications requiring maximum detail, extremely low noise, and Full HD format for micro-defect characterization.

SenS 1280 — HD resolution, GenICam compliant
An excellent choice for system integrators needing industrial standards, flexibility, and high sensor performance in a robust format.

Recommendation:

• Choose line-scan SWIR cameras for continuous, high-speed wafer or substrate inspection.
• Choose area-scan SWIR cameras for detailed defect review, lab analysis, or applications requiring high spatial resolution.

Boosting Yield and Quality Control

By integrating high-speed SWIR cameras into semiconductor inspection systems, manufacturers can detect hidden defects earlier in the process, reduce rework, and improve overall production yield.

NIT’s SWIR imaging solutions combine:

• High resolution
• High sensitivity for low-reflectivity surfaces
• High dynamic range for mixed-brightness scenes
• High frame rates for inline inspection

These features make NIT’s cameras a powerful tool for semiconductor manufacturers seeking to increase throughput while maintaining stringent quality standards.

Take the Next Step with NIT

As a SWIR camera designer and manufacturer based in France, New Imaging Technologies (NIT) offers a full range of SWIR imaging solutions — from line-scan cameras for high-speed inspection to Full HD area-scan systems for detailed analysis.

New Imaging Technologies Announces LiSaSWIR 2048 v2 – Next-Generation SWIR Line-Scan Camera Featuring new NSC2301Sensor

Introduction of new SWIR Line-scan Camera

New Imaging Technologies (NIT), a leading French manufacturer of InGaAs SWIR sensors and cameras, announces the launch of the LiSaSWIR 2048 v2, a high-performance upgrade of its line-scan SWIR camera series. Featuring NIT’s new high-performance sensor, the NSC2301, this upgraded model brings major enhancements in sensitivity, image quality, and system integration flexibility.

NIT’s new SWIR line-scan sensors – NSC2301 sensor

The new NSC2301 sensor delivers improved performance in terms of uniformity, noise, dark current, and gain control. With a pixel pitch of 8 µm, it offers the optimal balance between resolution and sensitivity while maintaining compatibility with the most common 1.1” format optics available on the lens market.

Engineered for demanding industrial environments, the LiSaSWIR 2048 v2 now supports line rates more than 110 kHz, with configurable exposure time and both ITR and IWR readout modes, enabling flexible adaptation to diverse scene dynamics and object speeds.

Key features of the LiSaSWIR 2048 v2

• Resolution: 2048×1 pixels
• Pixel Pitch: 8µm
• Frame Rate: > 110kHz
• Exposure Time
• Readout modes: ITR and IWR
• Dynamic Range: 66 dB typical
• Gain Modes: Multiple selectable settings
• Quantum Efficiency (QE)
• Interface: CameraLink
• Onboard Processing: Non-Uniformity Correction (NUC), Bad Pixel Replacement (BPR)
• Dimension: 35.4 x 75 x 68mm
• Weight: 280g
• Control protocol: GenCP (Genicam) compliant
• Optical Compatibility: 1.1” format lenses

With an optimized sensor size and performance trade-off, the LiSaSWIR 2048 v2 integrates easily into existing inspection systems, supporting precise detection and consistent results

Both the NSC2301 sensor and the LiSaSWIR 2048 v2 camera are developed and manufactured in NIT’s Production facility in France. NIT maintains full control of the design and production process, from ROIC design to sensor hybridization and camera assembly, ensuring high-volume production capacity, consistent quality, and long-term support.

Typical SWIR line-scan Applications

• Semiconductor and photovoltaic inspection
• Food and vegetable sorting
• Waste management and recycling
• Pharmaceutical packaging and process control

The LiSaSWIR 2048 v2 is ideally suited for applications such as semiconductor and solar cell inspection, food and waste sorting, and pharmaceutical quality control, where precision, reliability, and throughput are critical.

Availability of NIT’s new SWIR line-scan camera

The LiSaSWIR 2048 v2 is now available for demonstration and orders, with shipments scheduled for December 2025.

Contact us today to learn more about this new SWIR Line-scan camera

About New Imaging Technologies (NIT)

Part of LYNRED, New Imaging Technologies (NIT) designs, develops, and manufactures advanced SWIR sensors and cameras entirely in France. NIT offers a full range of SWIR InGaAs products from line-scan arrays to Full HD area sensors, featuring high sensitivity, ultra-low noise, and patented HDR imaging capabilities. With full in-house control from ROIC design to camera assembly, NIT serves industrial, scientific, and defense applications worldwide.

SWIR Cameras for Ground-Based Laser Communication: Clearer Signals, Even in Harsh Conditions

Ground-based laser communication systems are key to enabling ultra-fast, high-bandwidth data transmission between fixed stations, satellites, or mobile units. However, ensuring signal stability and precision in these systems is far from simple.

Ground-based Laser Communication Challenges:

They face several challenges:

• Atmospheric interference from fog, haze, smoke, or dust can scatter or block laser beams.
• Variable lighting conditions, including day-night transitions and background glare, can affect beam detection.
• Beam alignment and tracking require real-time, high-precision monitoring, often at long distances.
• Security and reliability demand clear, uninterrupted optical paths.

SWIR imaging (Short-Wave Infrared) provides a powerful solution to these issues. Unlike visible-light systems, SWIR cameras can “see” through challenging atmospheric conditions, offering higher contrast and better beam visibility. SWIR also enables covert operation, as many laser wavelengths used in telecom fall within the SWIR band.

Recommended SWIR Cameras for Laser Communication:

• SenS 1920: A Full HD, high-sensitivity SWIR camera, very low-noise of 25e-delivering exceptional image quality in degraded conditions—ideal for long-range beam profiling and precision tracking.
• WiDy SenS 320: A compact, high-speed QVGA SWIR camera, 1kHz Full frame, 10kHz (ROI), Ultra-short exposure times down to 10 µs, even 1µs in option. It is ideal for systems operating in rapidly changing lighting conditions.

From optical alignment to atmospheric monitoring, NIT SWIR cameras provide the performance and reliability required to keep ground-based laser communication systems operating at their best, regardless of weather conditions.

New Imaging Technologies (NIT), part of LYNRED, designs and manufactures advanced SWIR InGaAs sensors and cameras in France, tailored for demanding applications like laser communication.

New Imaging Technologies (NIT) announces the release of the WiDy SenS 320 SWIR camera with GigE interface, offering increased flexibility for system integrators across industrial, scientific, and laser imaging markets.

Designed and manufactured in France, this compact, robust SWIR camera is built around NIT’s patented dual-response InGaAs sensor (Linear & Logarithmic), providing unmatched dynamic range performance. The WiDy SenS 320 is engineered for high-speed imaging, delivering full-frame rates of up to 1 kHz and 10 kHz in ROI mode, making it ideal for capturing fast laser pulses or monitoring dynamic laser-based processes.

Key Features:

• 320×256 pixels resolution @ 15µm pixel pitch
• Frame rates up to 1kHz full-frame, and 10kHz in ROI mode
• Ultra-short exposure times down to 10 µs, even 1µs in option
• Dual-mode sensor: Logarithmic for high dynamic range, Linear for low noise
• Easy integration

Applications:

Thanks to its high frame rate, short integration time, and high dynamic range, the WiDy SenS 320 is an excellent solution for:

• Laser beam profiling
• Active alignment and calibration
• Monitoring laser welding, cutting, hot glass, foundries,…
• Short-pulse laser capture in R&D and industrial setups

Optional Accessories & Custom Variants:

OEM configurations: open frame housing, sensor without cover glass, sensor board flex extension, and more.

With the new GigE interface, the WiDy SenS 320 ensures seamless integration into existing imaging systems, making it a powerful and cost-effective SWIR camera for demanding industrial applications.

New Imaging Technologies (NIT) introduces the SenS 1920 L-ST, a high-performance SWIR camera designed for easy integration into industrial and surveillance systems. This model features a CameraLink interface via High-Speed Samtec LSHM connector, offering maximum flexibility for OEMs and system integrators. This interface allows system integrators to benefit from a well-known and reliable CameraLink interface without bulky standard connectors and cables. (Flexible stacking board-to-board connectors) 

With Full HD resolution (1920×1080 pixels) at 8 µm pixel pitch, the SenS 1920 delivers sharp and detailed SWIR images. The camera also ensures high sensitivity and low noise (25e⁻), making it ideal for demanding applications that require precise imaging performance. 

The SenS 1920 (L-ST) is suited for: 

• Industrial inspection (semiconductors, wafers, solar panels, etc.) 

• Surveillance and Defense systems (Gimbal, UAVs, etc.) 

• Scientific imaging 

In addition to the SenS 1920, NIT offers other SWIR cameras in OEM version, including: 

• SenS 1280 for HD resolution SWIR applications 

• WiDy SenS 640 for VGA HDR & High Sensitivity imaging 

All cameras are built around NIT’s in-house designed InGaAs SWIR sensors, manufactured in France, ensuring full control over performance, quality, and customization options. NIT supports OEMs with tailored solutions to meet specific integration needs. 

New Imaging Technologies (NIT) announces the release of its latest SWIR InGaAs line scan sensor, the NSC2301, designed for demanding industrial inspection applications. With advanced features and performance, this new sensor sets a benchmark in SWIR imaging for production environments.

Key features

• 0.9µm to 1.7µm spectrum
• 2048x1px @8µm pixel pitch
• 90e- readout noise
• Line rate >80kHz @ 2048 pixel resolution
• Single stage TEC cooling
• Configurable exposure times
• ITR & IWR readout modes

The NSC2301 features a 2048 x 1 resolution with an 8 µm pixel pitch, delivering sharp, detailed line-scan imaging. The size format is best suited to fit standard 1.1’’ optical format optics. This SWIR line-scan sensor supports line rates over 80 kHz, making it ideal for fast-moving inspection tasks. With configurable exposure times and both ITR (Integration Then Read) and IWR (Integration While Read) readout modes, the sensor offers unmatched adaptability for various lighting and motion conditions.

Thanks to its 3 gains available, the NSC2301 provides the perfect combination of High Sensitivity (read out noise 90e- in High Gain) and High Dynamic Range, crucial for imaging challenging materials or capturing subtle defects in high-speed production lines.

This new sensor expands NIT’s proprietary SWIR sensor portfolio and will be officially introduced at Laser World of Photonics 2025 in Munich.

Applications

Typical use cases for the NSC2301 include silicon wafer inspection, solar panel inspection, hot glass quality control, waste sorting, and optical coherence tomography, especially where high-resolution and high-speed line-scan imaging is critical.

Camera

Complementing the launch of the sensor, NIT will release LiSaSWIR v2, a high-performance camera integrating the NSC2301, in late summer. The camera will feature Smart CameraLink for fast data transmission and plug-and-play integration.

With the NSC2301, NIT continues its mission of delivering cutting-edge SWIR imaging technology, developed and produced in-house.

 

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