SWIR Drone-Based Inspection Introduction

As solar farms scale worldwide, operators are seeking faster, more reliable inspection methods to maximize energy output and reduce maintenance costs. Traditional inspection methods, based on visible or thermal imaging, often fail to detect early-stage defects. Short-Wave Infrared (SWIR) imaging integrated on drones is emerging as a powerful solution for advanced solar panel inspection, enabling the detection of defects invisible to conventional visible or thermal imaging.

Why Traditional Inspection Methods Fall Short

Conventional inspection technologies have clear limitations. Visible imaging depends heavily on lighting conditions and cannot reveal subsurface defects. Thermal imaging, while useful for identifying hotspots, typically detects issues only after they have already affected performance.

As a result, many critical defects—such as micro-cracks, early delamination, or moisture ingress—remain undetected during routine inspections. This can lead to reduced energy output, unexpected failures, and increased maintenance costs.

High-Performance InGaAs SWIR Solutions for Aerial PV Monitoring

New Imaging Technologies (NIT), part of LYNRED, a leading designer and manufacturer of high-performance SWIR InGaAs sensors and cameras, supports this application with a complete range of lightweight, high-resolution SWIR imaging solutions optimized for UAV integration.

Why SWIR Drone-Based Inspection for Solar Panel Farm?

SWIR imaging (typically 900–1700 nm) offers unique advantages for photovoltaic inspection:

• Detection of micro-cracks and cell damage not visible in the visible spectrum
• Identification of moisture ingress, delamination, and material inconsistencies
• Inspection under variable illumination conditions, including low light and partial shading
• Non-contact, fast aerial inspection of large solar farms

Compared to thermal imaging, SWIR enables earlier defect detection and greater spatial detail, making it ideal for preventive maintenance strategies.

SWIR Drone-Based Inspection: Key Benefits

When combined with UAV platforms, SWIR imaging becomes even more powerful. Drone-based inspection offers:

• Rapid coverage of large solar installations
• Reduced downtime and operational costs
• High spatial resolution defect localization
• Improved imaging data quality for AI-based analysis

NIT’s compact and low-power SWIR solutions are specifically designed to meet the SWaP (Size, Weight, and Power) constraints of drone platforms.

NIT’s SWIR Product Portfolio for UAV Solar Inspection

High-Resolution SWIR Cameras

For turnkey inspection systems, NIT offers:

• High-resolution SWIR cameras up to Full HD
• Robust industrial interfaces (CameraLink, USB, GigE, depending on model)
• High dynamic range and low readout noise
• Suitable for R&D, pilot projects, and operational deployments

SenS 1920

Board-Level & Naked SWIR Modules

For tight UAV integrations, NIT provides:

• Naked sensor modules and board-level SWIR cameras
• Lightweight and compact form factors
• Easy integration into custom gimbals or payloads
• Optimized for embedded vision and aerial platforms

WiDy SenS 640/ WiDy NaNo 640

SWIR InGaAs Sensors

NIT designs and manufactures high-performance InGaAs SWIR sensors, offering:

• Resolutions up to Full HD (1920 × 1080)
• Low noise and high sensitivity
• Excellent uniformity and stability
• Ideal for OEM drone payload developers

SWIR Sensor NSC1601

SWIR Drone-Based Inspection: Enabling the Next Generation of Solar Farm Monitoring

The integration of SWIR imaging into drone inspection workflows opens the door to data-driven solar asset management. High-quality SWIR data can be combined with analytics and AI tools to automate defect detection, prioritize maintenance, and optimize system performance.

As solar farms continue to grow in scale and complexity, the need for accurate, efficient, and scalable inspection technologies will only increase. SWIR drone imaging stands out as a future-proof solution that delivers both precision and operational efficiency.

By combining SWIR imaging and drone technology, solar operators gain access to more precise diagnostics, earlier fault detection, and higher inspection efficiency.

With its complete portfolio of SWIR sensors, modules, and cameras, NIT supports UAV manufacturers, system integrators, and solar inspection specialists in deploying reliable, high-performance aerial inspection solutions.

Introduction

New Imaging Technologies (NIT), a LYNRED company, announces that theLiSa SWIR 2048R M-STE2 is now available for order. The camera was first presented at SPIE Photonics West 2026 and is now ready for commercial deployment.

Rectangular-Pixel SWIR Camera

The LiSa SWIR 2048R is a rectangular-pixel SWIR camera optimized for Spectroscopy and Optical Coherence Tomography (OCT). Based on the proven LiSa SWIR 2048 v2 platform, it features a rectangular pixel format (8 × 200 µm) designed for spectroscopic and line-scan optical architectures, enabling efficient light collection and high signal performance in demanding applications.

The LiSa SWIR camera family also includes the LiSa SWIR 2048 standard version, a line-scan SWIR camera widely used in industrial inspection applications such as material sorting, semiconductor inspection, and quality control, where reliability, sensitivity, and robustness are critical.

With the commercial availability of theLiSa SWIR 2048R, NIT further expands its LiSa SWIR portfolio, offering tailored SWIR camera solutions forindustrial, scientific, and medical instrument manufacturers.

For ordering information or technical details, don’t hesitate to get in touch with NIT

Introduction

NIT Launches LiSa SWIR 2048R M-STE2, Rectangular SWIR Camera at SPIE Photonics West 2026

New Imaging Technologies (NIT) announces the launch of LiSa SWIR 2048R M-STE2, a new rectangular-pixel SWIR camera based on the proven LiSaSWIR 2048 v2 platform. The new camera will be officially introduced at SPIE Photonics West 2026, taking place from January 20 to 22, 2026, in San Francisco, USA.

LiSaSWIR 2048 v2 Launch

Rectangular SWIR camera’s Key features

The LiSa SWIR 2048R M-STE2 has been specifically designed for hyperspectral imaging, spectroscopy, and Optical Coherence Tomography (OCT) applications. It features a rectangular pixel format of 8 × 200 µm, optimized for line-scan and spectroscopic optical architectures. This geometry enables efficient light collection and enhanced performance in applications requiring precise spectral information.

• Rectangular pixel (8×200µm)
• Application: Hyperspectral imaging, spectroscopy, OCT

By extending the LiSa SWIR 2048 v2 camera into a rectangular format, NIT expands its LiSa SWIR camera family, offering system integrators and instrument manufacturers greater flexibility for advanced SWIR system designs while maintaining the performance, reliability, and robustness expected from NIT solutions.

Upcoming launch at SPIE Photonics West 2026

NIT will showcase the LiSa SWIR 2048R M-STE2 SWIR camera at booth #1866 during SPIE Photonics West 2026. Visitors are invited to meet the NIT team to learn more about this new camera and discuss application requirements.

Meet the NIT team on site:

• Régis Tulaza –  Director of Sales
• Martin du Tertre – Regional Sales Manager
• Martin Schweitzer -Technical Manager

About New Imaging Technologies (NIT)

New Imaging Technologies (NIT), a Lynred company, designs and manufactures high-performance SWIR cameras and image sensors for scientific, industrial, and defense applications.

2025 SWIR Camera Performance Milestones and Prepares for 2026

As 2025 comes to a close, New Imaging Technologies (NIT) highlights the key achievements that have shaped its SWIR camera roadmap over the past year. Throughout 2025, NIT continued to strengthen its position as a leading designer and manufacturer of Short-Wave Infrared (SWIR) cameras, focusing on performance, system integration, and reliability for industrial inspection, scientific, and defense applications.

Driven by growing market demand for higher speed, higher resolution, and easier integration, NIT’s developments in 2025 addressed the evolving requirements of advanced imaging systems.

High-Speed and High-Resolution Line-Scan SWIR Camera Performance

One of the most significant milestones of 2025 was the advancement of line-scan SWIR camera technology, achieving line rates above 110 kHz for high-throughput applications. These speeds enable faster inspection processes in environments where productivity and accuracy are critical.

In parallel, NIT introduced a new line-scan generation, LiSaSWIR 2048 v2, featuring a 2048 × 1 resolution with an 8 µm pixel pitch, combining increased spatial resolution with high acquisition speed. This evolution supports more detailed inspection while maintaining the throughput required in industrial inspection and related applications.

These capabilities are exemplified by the latest line-scan developments, which are designed to support demanding use cases such as materials inspection, semiconductor processing, and Optical Coherence Tomography (OCT), where both speed and precision are essential.

High-Speed Area-Scan SWIR Imaging for Dynamic Applications

In the area-scan segment, NIT continued to push the limits of high-speed SWIR imaging. During 2025, its SWIR cameras enabled frame rates of up to 1 kHz full-frame, with up to 10 kHz in region-of-interest (ROI) modes.

These high frame rates, combined with ultra-short exposure times, enable the accurate capture of fast, dynamic scenes while maintaining image quality and sensitivity. Such performance is particularly relevant for applications involving motion analysis, real-time monitoring, and time-critical imaging processes.

WiDy SenS 320

By expanding both line-scan and area-scan performance, NIT reinforced its ability to address a wide range of SWIR imaging requirements using consistent technologies and platforms.

OEM-Optimized SWIR Camera Platforms and Interfaces

Beyond raw performance, 2025 also marked continued progress in OEM-optimized SWIR camera architecture. NIT focused on delivering compact, rugged, and integration-ready platforms designed to simplify system development for industrial and defense customers.
These platforms support a variety of interfaces and system configurations, enabling reliable board-to-board and board-to-cable integration while maintaining robustness in challenging operational environments. This approach reflects NIT’s long-term commitment to supporting embedded system designers and system integrators with SWIR cameras that are both high-performance and practical to deploy.

WiDy SenS 320 GigE | SenS 1920 Compact CamLink.

Full HD SWIR Camera Integration Successes

During 2025, Full HD SWIR cameras, SenS 1920,  achieved successful integration into advanced industrial and defense systems. These integration successes confirm the maturity and reliability of NIT’s high-resolution SWIR imaging solutions in demanding operational conditions.

By combining Full HD resolution with optimized interfaces and stable performance, NIT’s SWIR cameras continue to meet the expectations of customers developing complex imaging systems with long lifecycle requirements.

Looking Ahead to 2026: Meet NIT at SPIE Photonics West

SWIR cameras will be presented at NIT’s booth, SPIE Photonics West 2026

Looking forward, NIT will continue to advance its SWIR camera portfolio in 2026, with a focus on performance scalability, integration efficiency, and application-driven innovation.

NIT invites customers and partners to meet its team at SPIE Photonics West 2026, taking place in San Francisco, California, from January 20 to 22, 2026, at Booth #1866.

Book your appointment

Visitors will have the opportunity to explore NIT’s comprehensive SWIR camera portfolio, spanning line-scan to Full HD, and discuss upcoming projects with NIT and LYNRED experts, who will also be present to share their expertise in infrared technologies.

Season’s Greetings and Office Closure

NIT thanks its customers, partners, and collaborators for their continued trust throughout 2025 and wishes everyone a Merry Christmas and a Happy New Year.

Please note that NIT offices will be closed on December 25, 2025, and January 1, 2026.

About New Imaging Technologies (NIT)

New Imaging Technologies (NIT) designs and manufactures high-performance SWIR sensors and SWIR cameras for industrial inspection, scientific research, defense, and medical applications. Based in France, NIT delivers advanced SWIR imaging solutions optimized for demanding environments and system-level integration.

Introduction

High-speed SWIR cameras and line-scan SWIR cameras are becoming essential tools for modern industrial inspection, semiconductor manufacturing, laser monitoring, and other advanced imaging fields where speed, sensitivity, and reliability are critical. As demand for higher throughput and better detection capabilities grows, Short-Wave Infrared (SWIR) imaging provides unique advantages by revealing details invisible to standard visible cameras. In this article, we explore how SWIR imaging enhances high-speed industrial inspection workflows and how different SWIR camera architectures—line-scan and area-scan—fit into various application needs.

Challenges in Semiconductor Inspection

Semiconductor manufacturing demands exceptional precision and reliability at every stage — from wafer fabrication to packaging. Detecting micro-defects such as cracks, contamination, or pattern irregularities is crucial to maintain high yield and prevent costly failures.

Traditional visible-light cameras often fail to reveal such defects because silicon, the primary material in semiconductor devices, is opaque to visible light but transparent in the Short-Wave Infrared (SWIR) spectrum. As a result, a high-speed SWIR camera becomes a critical tool for detecting defects hidden beneath silicon surfaces.

As inspection lines move toward higher speeds and smaller geometries, manufacturers require high-performance SWIR cameras (Line-scan, Area-scan) that can deliver excellent image quality, speed, and stability under demanding industrial conditions.

Detecting Micro-Defects with High-Speed SWIR Cameras

SWIR cameras enable engineers to see beyond the visible spectrum, revealing information invisible to traditional imaging systems. In semiconductor production, they are used for:

• Wafer and die inspection: Detecting micro-cracks, edge chips, and surface irregularities.
• Bond and interconnect analysis: Inspecting layers and verifying bonding integrity.
• Encapsulation and packaging inspection: Identifying trapped particles or voids in encapsulant materials.

NIT’s high-speed SWIR cameras are built around proprietary InGaAs sensor technology designed for high sensitivity, low noise, and high dynamic range. These features ensure reliable defect detection, even in high-reflectance environments typical of semiconductor manufacturing.

Line-Scan vs Area-Scan SWIR Cameras

Choosing between a line-scan and an area-scan SWIR camera depends on the inspection setup, the object’s motion, and the required resolution.

Line-Scan SWIR Cameras

Line-scan SWIR cameras capture one line of pixels at a time as the object moves under the field of view. They are ideal for continuous or moving inspection processes such as:

• Wafer or substrate inspection on conveyor systems
• Web or roll-to-roll material analysis
• Inline defect detection during dicing or polishing

Advantages:

• Perfect for high-speed scanning and continuous processes
• Offers uniform illumination and consistent resolution across long surfaces
• Easily integrated into industrial automation systems

Considerations:

• Requires precise synchronization between the camera and object motion
• Not suited for static or randomly positioned samples

LiSaSWIR 2048 v2 – New Line-scan SWIR camera
Ideal for semiconductor inspection lines requiring high resolution, high speed, and excellent uniformity. Its 2048-pixel resolution delivers outstanding defect and edge detection on silicon wafers and semiconductor substrates.

LiSaSWIR 2048 image example

Area-Scan SWIR Cameras

Area-scan cameras capture a full image frame at once, making them suitable for stationary or small field-of-view inspection tasks. These cameras are particularly effective for detailed defect analysis, component inspection, or laboratory evaluation.

NIT offers a complete range of area-scan SWIR cameras, from QVGA to Full HD resolution, enabling users to choose the best fit for their inspection needs — from compact, high-speed sensors to large-format, high-resolution imaging systems.

Advantages:

• Provides instant full-field images, ideal for stationary samples or slow-moving processes
• Supports high-resolution imaging for fine defect analysis
• More flexible setup — no motion control required

Considerations:

• Limited by frame rate for continuous line inspections
• May require higher bandwidth interfaces for large-format models

SenS 1920 — Full HD resolution, high sensitivity
Perfect for applications requiring maximum detail, extremely low noise, and Full HD format for micro-defect characterization.

SenS 1280 — HD resolution, GenICam compliant
An excellent choice for system integrators needing industrial standards, flexibility, and high sensor performance in a robust format.

Recommendation:

• Choose line-scan SWIR cameras for continuous, high-speed wafer or substrate inspection.
• Choose area-scan SWIR cameras for detailed defect review, lab analysis, or applications requiring high spatial resolution.

Boosting Yield and Quality Control

By integrating high-speed SWIR cameras into semiconductor inspection systems, manufacturers can detect hidden defects earlier in the process, reduce rework, and improve overall production yield.

NIT’s SWIR imaging solutions combine:

• High resolution
• High sensitivity for low-reflectivity surfaces
• High dynamic range for mixed-brightness scenes
• High frame rates for inline inspection

These features make NIT’s cameras a powerful tool for semiconductor manufacturers seeking to increase throughput while maintaining stringent quality standards.

Take the Next Step with NIT

As a SWIR camera designer and manufacturer based in France, New Imaging Technologies (NIT) offers a full range of SWIR imaging solutions — from line-scan cameras for high-speed inspection to Full HD area-scan systems for detailed analysis.

New Imaging Technologies Announces LiSaSWIR 2048 v2 – Next-Generation SWIR Line-Scan Camera Featuring new NSC2301Sensor

Introduction of new SWIR Line-scan Camera

New Imaging Technologies (NIT), a leading French manufacturer of InGaAs SWIR sensors and cameras, announces the launch of the LiSaSWIR 2048 v2, a high-performance upgrade of its line-scan SWIR camera series. Featuring NIT’s new high-performance sensor, the NSC2301, this upgraded model brings major enhancements in sensitivity, image quality, and system integration flexibility.

NIT’s new SWIR line-scan sensors – NSC2301 sensor

The new NSC2301 sensor delivers improved performance in terms of uniformity, noise, dark current, and gain control. With a pixel pitch of 8 µm, it offers the optimal balance between resolution and sensitivity while maintaining compatibility with the most common 1.1” format optics available on the lens market.

Engineered for demanding industrial environments, the LiSaSWIR 2048 v2 now supports line rates more than 110 kHz, with configurable exposure time and both ITR and IWR readout modes, enabling flexible adaptation to diverse scene dynamics and object speeds.

Key features of the LiSaSWIR 2048 v2

• Resolution: 2048×1 pixels
• Pixel Pitch: 8µm
• Frame Rate: > 110kHz
• Exposure Time
• Readout modes: ITR and IWR
• Dynamic Range: 66 dB typical
• Gain Modes: Multiple selectable settings
• Quantum Efficiency (QE)
• Interface: CameraLink
• Onboard Processing: Non-Uniformity Correction (NUC), Bad Pixel Replacement (BPR)
• Dimension: 35.4 x 75 x 68mm
• Weight: 280g
• Control protocol: GenCP (Genicam) compliant
• Optical Compatibility: 1.1” format lenses

With an optimized sensor size and performance trade-off, the LiSaSWIR 2048 v2 integrates easily into existing inspection systems, supporting precise detection and consistent results

Both the NSC2301 sensor and the LiSaSWIR 2048 v2 camera are developed and manufactured in NIT’s Production facility in France. NIT maintains full control of the design and production process, from ROIC design to sensor hybridization and camera assembly, ensuring high-volume production capacity, consistent quality, and long-term support.

Typical SWIR line-scan Applications

• Semiconductor and photovoltaic inspection
• Food and vegetable sorting
• Waste management and recycling
• Pharmaceutical packaging and process control

The LiSaSWIR 2048 v2 is ideally suited for applications such as semiconductor and solar cell inspection, food and waste sorting, and pharmaceutical quality control, where precision, reliability, and throughput are critical.

Availability of NIT’s new SWIR line-scan camera

The LiSaSWIR 2048 v2 is now available for demonstration and orders, with shipments scheduled for December 2025.

Contact us today to learn more about this new SWIR Line-scan camera

About New Imaging Technologies (NIT)

Part of LYNRED, New Imaging Technologies (NIT) designs, develops, and manufactures advanced SWIR sensors and cameras entirely in France. NIT offers a full range of SWIR InGaAs products from line-scan arrays to Full HD area sensors, featuring high sensitivity, ultra-low noise, and patented HDR imaging capabilities. With full in-house control from ROIC design to camera assembly, NIT serves industrial, scientific, and defense applications worldwide.