NIT - New Imaging Technologies
  • SWIR products
    • Selectors
    • SWIR cameras
      • SenS 1920
      • SenS 1280
      • WiDy SenS 640
      • WiDy SenS 320
      • WiDy SWIR 640
      • WiDy SWIR 320
      • WiDy NaNo 640
      • HiPe SenS 640
      • LiSaSWIR 2048
    • SWIR InGaAs Sensors
      • NSC1601
  • CMOS products
  • Applications
    • Semiconductor Inspection
    • Laser
    • Welding & Additive Manufacturing
    • Security & Surveillance
    • Microscopy & Life science
    • Other applications
  • Support
    • Software
    • Download
  • About us
  • News
  • Contact
Select Page

News

Full HD resolution : SenS 1920 A New Jewel in our SWIR Camera Portfolio

Full HD resolution : SenS 1920 A New Jewel in our SWIR Camera Portfolio

Jul 2, 2024

read more
A new offer from NIT

A new offer from NIT

May 7, 2024

read more
New High-Resolution, SWIR Sensor with High Performance

New High-Resolution, SWIR Sensor with High Performance

Apr 23, 2024

read more
New release SWIR products at SPIE DCS

New release SWIR products at SPIE DCS

Apr 9, 2024

read more
WiDy SenS 320 – NEW High-Speed Version

WiDy SenS 320 – NEW High-Speed Version

Mar 13, 2024

read more
A new SWIR sensor in NIT portfolio

A new SWIR sensor in NIT portfolio

Jan 31, 2024

read more
Two New Models of SWIR Megapixel Cameras

Two New Models of SWIR Megapixel Cameras

Jan 9, 2024

read more
Happy Holidays !

Happy Holidays !

Dec 22, 2023

read more
NITVision 1.5 and NITLibrary 3.4.2 –  Enhanced Compatibility and Feature updates

NITVision 1.5 and NITLibrary 3.4.2 – Enhanced Compatibility and Feature updates

Nov 21, 2023

read more
Enhancing Solar Panel Efficiency with SWIR Solar Panel Inspection

Enhancing Solar Panel Efficiency with SWIR Solar Panel Inspection

Nov 16, 2023

read more
NIT and INSP will exhibit the world’s first HgTe CQD SWIR camera in Paris

NIT and INSP will exhibit the world’s first HgTe CQD SWIR camera in Paris

Nov 7, 2023

read more
Overcoming Challenges in SWIR Semiconductor Inspection: Solutions and Advancements

Overcoming Challenges in SWIR Semiconductor Inspection: Solutions and Advancements

Oct 5, 2023

read more
« Older Entries
Next Entries »

Subscribe

Join Our Newsletter

Success!

Privacy Policy

Subscribe

  • Follow
  • Follow
  • Follow
Logo NIT by Lynred Premium SWIR
  • Follow
  • Follow
  • Follow

Terms & Conditions

  • General Terms & Conditions of Sales
  • Standard Terms and Conditions for Purchase
  • Quality Policy
  • LYNRED GROUP ETHICAL GUIDELINES
  • Charte Achats Responsables
logo iso logo made in france
france relance logo
logo region ile de france logo power by paris region

Join our list to receive the latest news

Success!

Privacy Policy

Subscribe

LYNRED logo
LYNRED USA logo

© 2024 New Imaging Technologies (NIT) – All rights reserved.

Privacy Policy

Legal Statements