New Imaging Technologies (NIT) thanks the French Government for their support with the “France Relance” Program in developing the industrialization of our novel in-house stacking technology, recognizing NIT’s breakthrough R&D process development in SWIR sensor production. NIT will be able to address volume production and high-resolution SWIR sensors with this industrialization process
Enhancing Semiconductor Inspection with High-Speed SWIR Cameras
Introduction High-speed SWIR cameras and line-scan SWIR cameras are becoming essential tools for modern industrial inspection, semiconductor manufacturing, laser monitoring, and other advanced imaging fields where speed, sensitivity, and reliability are critical. As...
