New Imaging Technologies (NIT) announces the release of its latest SWIR InGaAs line scan sensor, the NSC2301, designed for demanding industrial inspection applications. With advanced features and performance, this new sensor sets a benchmark in SWIR imaging for production environments.
Key features
- 0.9µm to 1.7µm spectrum
- 2048x1px @8µm pixel pitch
- 90e- readout noise
- Line rate >80kHz @ 2048 pixel resolution
- Single stage TEC cooling
- Configurable exposure times
- ITR & IWR readout modes
The NSC2301 features a 2048 x 1 resolution with an 8 µm pixel pitch, delivering sharp, detailed line-scan imaging. The size format is best suited to fit standard 1.1’’ optical format optics. This SWIR line-scan sensor supports line rates over 80 kHz, making it ideal for fast-moving inspection tasks. With configurable exposure times and both ITR (Integration Then Read) and IWR (Integration While Read) readout modes, the sensor offers unmatched adaptability for various lighting and motion conditions.
Thanks to its 3 gains available, the NSC2301 provides the perfect combination of High Sensitivity (read out noise 90e- in High Gain) and High Dynamic Range, crucial for imaging challenging materials or capturing subtle defects in high-speed production lines.
This new sensor expands NIT’s proprietary SWIR sensor portfolio and will be officially introduced at Laser World of Photonics 2025 in Munich.
Applications
Typical use cases for the NSC2301 include silicon wafer inspection, solar panel inspection, hot glass quality control, waste sorting, and optical coherence tomography, especially where high-resolution and high-speed line-scan imaging is critical.
Camera
Complementing the launch of the sensor, NIT will release LiSaSWIR v2, a high-performance camera integrating the NSC2301, in late summer. The camera will feature Smart CameraLink for fast data transmission and plug-and-play integration.
With the NSC2301, NIT continues its mission of delivering cutting-edge SWIR imaging technology, developed and produced in-house.
