SenS 1280
High Sensitivity SXGA SWIR camera
- SXGA resolution – 1280x1024px @10µm pixel pitch
- Linear response mode: High sensitivity
- Read-out noise 30e-
- USB 3.0 & CameraLink & SDI & CxP interface
- TEC1
- Available in Compact & Smart
- GenICam compliant (Smart)
Technical Specification
SenS 1280 | SenS 1280 (Smart) | |
---|---|---|
Key features | NUC & BPR Selective line scanning Multi ROI: up to 8 vertically stacked blocks | On-board NUC & BPR Automatic Gain Control (Brightness/Contrast) Automatic Integration Time (AIT) GenICam compliant |
Output | USB 3.0, CameraLink | CameraLink, HD-SDI, CxP |
Dimensions | 58x58x70mm | 58x58x64/72mm |
Weight | <400g | <400g |
GUIs | NITVision | NITGenicamControlTool |
SDKs (USB & GigE) | x86-64 & Arm64 (C++,C#, Python) | - |
Sensor | NSC1901T-SI |
Material | InGaAs |
Resolution | 1280x1024 |
Pixel pitch | 10μm |
Spectral response | 0.9 to 1.7μm |
Dual response | Linear (CTIA) Low & High Gain |
Modes | ITR, CDS, ROI |
QE | >80% (LG) |
Frame rate | 60Hz full frame |
Partial Reading Mode |
|
Exposure time | 10μs - 500ms |
Trigger | Software or hardware
Selectable delay |
Power Range | 12V |
Dimension | 58x58x70mm |
Mount | C-Mount native |
ADC | 14 bits |
Operating Temp | -40°C to +71°C |
Operating modes
CTIA High Gain | CTIA Low Gain | |
---|---|---|
Sensor noise | typ. 30e- | 120e- |
Well capacity | >10Ke- | >130Ke- |
Dynamic Range | 52dB | 61dB |
Software
Interface | GUI | SDK |
USB 3.0 | NITVision | Yes |
CameraLink(Compact) | NITVision | No |
CameraLink(Smart) | NITGenicamControlTool | No |
CxP(Smart) | NITGenicamControlTool | No |
SDI (Smart) | NITGenicamControlTool | No |
Image example
Comparison between VGA & SXGA image
Thanks to the new NIT in-house designed sensor – NSC1901T-SI, SenS 1280 SWIR camera provides a higher resolution image (1280×1024). You can see better details with higher sharpness with no distortion, especially when zooming in.
Applications
The SenS 1280 camera is the perfect choice for multiple applications. The pure linear mode (High sensitivity with low noise 30e-) offers the ability to be used as a beam diagnostic tool. Its 1280 x 1024 pixels resolution offers a better field of view for inspection of semiconductor or solar cell panels. Also, SXGA resolution will give you extended possibilities for Defense & Security applications with better details and sharpness.