SWIR Line-scan array camera
- NIT in-house designed InGaAs sensor (2048×1 pixels @7.5µm)
- Bad Pixels Replacement and embedded Non Uniformity Correction
- CameraLink interface
Softwares are provided for our SWIR camera :
- NITLink is compatible with CameraLink and Analog SWIR embedded Cameras
To run NIT Software, the minimum system requirements are:
- Windows 8, 8.1 & 10
- 32 bit or 64 bit
- 4 GB RAM (minimum), 8GB RAM (recommended)
- Frames grabber compatible: Dalsa ImperX
- Intel Pro/1000 network card (or equivalent) with Jumbo Frames
To download our software, please register/ log-in at our Download page.
With its unique performances and features, the LiSaSWIR 2048 is the perfect camera for industrial applications. Its 2048×1 pixels resolution with frame rate 60kHz, Bad Pixels Replacement and embedded Non Uniformity Correction offer a comfortable Field of view for inspection of semiconductor/wafer/solar cell panel or food sorting, hot glass inspection.
CameraLink interface, compact size of 46* 46 * 65.6 mm, light weight, LiSaSWIR is easy to integrate in any process control system.
Curious about Line-scan array SWIR camera? Here are some images captured by LiSaSWIR 2048.
Comparison of Chipset image
Made with Visible Linescan camera (left) vs. the new LiSa SWIR (right)
Thanks to LiSa SWIR, you will be able to inspect through integrated circuit chips for quality inspection. Defect can be easily detected as cracks, void, particules…
Image of a Si Wafer captured by the LiSa SWIR 2048
As Silicon is transparent to Short Wave Infrared wavelength (SWIR), back side wafer inspection can be done, to detect defect, pattern alignment, pattern defect inspection, and edge-position bonding inspection.
Obtain a suitable SWIR solution!
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